Scanning Electron Microscopy

Images a surface's topography and composition by scanning it with a focused electron beam and detecting emitted electrons.

References

• Goldstein, J.I., Newbury, D.E., Michael, J.R., Ritchie, N.W.M., Scott, J.H.J., Joy, D.C. Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. Springer, 2018.